KLA TENCOR P10

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• KLA TENCOR P10

KLA / TENCOR P10 Wafer Testing and Metrology Equipment is a user-friendly, automated, and flexible metrology system designed to meet the particular needs of semiconductor and wafer manufacturers around the world. KLA P-10 offers complete testing, analysis, and optimization of both bare and processed wafers. It utilizes advanced wafer-level measurement techniques, precise mechanical measurements, and non-destructive analysis. TENCOR P 10’s unique scanning metrology process enables it to take precise measurements of the physical characteristics of a wafer without damaging or altering the material. This allows for accurate wafer quality assurance and defect analysis. It also provides the flexibility to perform rapid wafer surface and critical dimension (CD) metrology measurements within a single process. The unit is equipped with a kinematic sample holder for improved positioning accuracy and enhanced repeatability, as well as multiple probe heads for chemical-mechanical planarization (CMP), thin-film measurements, and surface analysis. It is also integrated with a digital imaging video camera for visual inspection and defect analysis. TENCOR P10’s advanced software is powered by an intuitive graphical user interface (GUI) which provides customizable parameters and measurement configurations. This ensures efficient and accurate operation, even for users who have limited experience with wafer-level metrology systems. It also integrates with third-party tools such as process chamber and waterfront inspection systems. P10 allows for comprehensive analysis of both bare and processed wafers. It can measure surface characteristics such as profile, thickness, defect density, step height, and optical parameters. It can also assess 3D topography, detect trace defects, and measure critical dimensions of the wafer surface. This enables wafer manufacturers to identify process abnormalities, optimize their CMP process, and improve overall wafer manufacturing quality. Overall, KLA P10 Wafer Testing and Metrology Machine is an essential tool designed to ensure accuracy and reliability in semiconductor and wafer manufacturing. It is a powerful and versatile tool which offers an innovative and cost-effective solution for wafer evaluation and process optimization.

Selling “AS IS, WHERE IS.” We do not have the capability to test this equipment. System was de-installed in working operational condition. All returns must comply with stated Return Policy. Please continue:

PAYMENT OPTIONS:

We accept PayPal, Company Check, Wire Transfers. .

TAXES & FEES:

California Sales Tax applies if order within California at 8%. Handling charges may apply.  Your cost is the price of your item, shipping/handling charge,  insurance, and sales tax if applicable.  

REFUNDS & RETURNS:

No returns after 14 days. Returns must have good reason for return, i.e. defective items, missing items, or items not described accurately. Returned items must be in same condition as shipped for refund. PLEASE Contact before leaving Negative Feedback in the seller review. 

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IF THERE ARE ANY PROBLEMS WITH THE ITEM DO NOT TRY TO REPAIR AND INVESTIGATE. 

CONTACT US IMMEDIATELY.

WARRANTY IS NULL VOID IF ANY ITEM IS TAMPERED WITH, OPENED OR DISASSEMBLED.  

WE HAVE SEVERAL WAREHOUSES. 

Please check with us about ITEM’S AVAILABILITY prior to ordering.

UPON RECEIPT OF YOUR PURCHASE PLEASE PHOTOGRAPH, DOCUMENT, AND SAVE ALL PACKAGING WHETHER DAMAGE IS VISIBLE OR NOT. ALL CLAIMS MUST BE REPORTED AND ACKNOWLEDGED WITHIN 72 HRS OF RECEIPT.